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1

Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /

Book

Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /

Fink, Thomas
2018

“...FZJ - Schriftenreihen des Forschungszentrums Jülich...”
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2

Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem solar-cells /

Book

Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem...

Michard, Stephan Yann
2015

“...FZJ - Schriftenreihen des Forschungszentrums Jülich...”
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