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silicon
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crystal structure analysis
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Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Fink, Thomas
2018
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Highly conductive electrodes as diffusion barrier for high temperature applications /
Mesic, Biljana
2010
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Fink, Thomas
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Mesic, Biljana
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crystal structure analysis
silicon
dielectric material
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electrical properties
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microtechnology
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nitride
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perovskite
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raman spectroscopy
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tantalate
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CUSE - Raman spectroscopy
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FCA - Crystallography
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FCBH - Crystal structure of specific substances
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