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Sanders, J. V.
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Sanders, J. V.
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Physical : International Congress on Electron Microscopy. 0008 vol 0001 : Canberra, 25.08.74-31.08.74.
Sanders, J. V.
1974
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Biological : International Congress on Electron Microscopy. 0008 vol 0002 : Canberra, 25.08.74-31.08.74.
Sanders, J. V.
1974
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Sanders, J. V.
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ceramics
1
electron diffraction
1
electron source
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epitaxy
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film
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grain boundary
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magnetic field
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phase transition
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plastic deformation
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radiation damage
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semiconductor
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surface
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FHG - Electron microscopy
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