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1
Book
Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern /
Bartsch, H.
1987
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Name
Bartsch, H.
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Subject
electron microscopy
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interface
semiconductor
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Classification
FFPE - Thin film electronic properties, semiconductor interfaces
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FGML - Characterization of electronic materials
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FHGB - Conventional electron microscopy
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Language
German
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