Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Reset Filters
Gilfrich, John V.
Reset Filters
Show filters (1)
Gilfrich, John V.
Ask a Librarian
Books & more
: Hits
1 - 3
of
3
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
[Proceedings of the Annual Conference on Applications of X-ray Analysis. 39 : held July 31-August 4, 1995, in Colorado Springs, Colorado] /
Gilfrich, John V.
1997
“
...
CUK
-
X
-
ray
spectroscopy
...
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 2
2
Book
Annual conference on applications of X-ray analysis. 41. Proceedings : Colorado-Springs, CO, 03.08.96-07.08.96 /
Gilfrich, John V.
1995
“
...
CUK
-
X
-
ray
spectroscopy
...
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select result number 3
3
Book
Annual conference on applications of X-ray analysis. 42. Proceedings : Denver, CO, 02.08.93-06.08.93 /
Gilfrich, John V.
1995
“
...
CUK
-
X
-
ray
spectroscopy
...
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
/* Narrow Search Options */ ?>
Back
Narrow Search Results
Available as
Print Edition
3
Material Type
Book
3
Type of Literature
Conference Publication
3
Year of Publication
From:
To:
Location
ZB
3
Name
Gilfrich, John V.
Subject
X-ray analysis
3
diffraction
3
mechanical stress
3
X-ray spectroscopy
2
instrumentation
2
polymer
2
more ...
strain
2
X-ray diffraction
1
X-ray scattering
1
X-ray source
1
X-ray spectrometer
1
counting device
1
detector
1
determination
1
epitaxy
1
film
1
geology
1
high temperature
1
industrial use
1
monochromator
1
monocrystal
1
online measuring method
1
powder diffraction
1
reflection
1
semiconductor
1
structure
1
thin film
1
see all ...
less ...
Classification
CUK - X-ray spectroscopy
3
Language
English
3
/* End Narrow Search Options */ ?>
×
Loading...