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1
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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
Benninghoven, Alfred
1987
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IBN-1-2
IEK-14
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ZB
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Name
Benninghoven, Alfred
1
Rüdenauer, Friedrich G.
1
Werner, H. W.
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Subject
SIMS (secondary ion mass spectroscopy)
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FGGJ - Ion beam analysis, ion beam solid interaction
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English
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