1
Betrachtung der Kristallinitätsentwicklung in mikrokristallinem Dünnschicht-Silizium mit in-situ Raman-Spektroskopie /
Book
2
Relation between growth rate, material quality, and device grade condition for intrinsic microcrystalline silicon : from layer investigation to the application to thin-film tandem solar-cells /
Book
3
Structure of crystals.
Book
...FCD - Kristallphysik...