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Archard, Geoffry D.
2
Arifov, Ubal Arifovich
2
Asano, Mitsuru
2
Cardona, Manuel
2
Glaefeke, H.
2
Harada, Toshio
2
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Kessler, Joachim.
2
Kubo, Kenji
2
Andren, H.-O.
1
Andrews, Peter T.
1
Baer, Yves
1
Becker, K.
1
Beckey, H. D.
1
Benz, Reinhard.
1
Binkele, Ludolf.
1
Birkner, Alexander
1
Breitwieser, R.
1
Bruining, H.
1
Bruining, Hajo.
1
Campagna, M.
1
Citrin, P. H.
1
Collins, I. R.
1
Cutler, P. H.
1
Dose, V.
1
Elrod, S. A.
1
Feder, R.
1
Ferguson, Mona M.
1
Feuerbacher, B.
1
Fink, J.
1
Fomenko, Vladlen Stepanovich.
1
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photoemission
10
exoelectron emission
5
electron emission
4
field emission
4
secondary electron emission
3
atom probe field ion microscopy
2
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ion emission
2
scanning electron microscopy
2
spin polarized electron scattering
2
thermionic emission
2
thin film
2
work function
2
Raman effect
1
XANES (x-ray absorption near edge structure)
1
catalysis
1
cathode
1
dichroism
1
electrode
1
electron energy loss spectroscopy
1
electron spectroscopy
1
field emission microscopy
1
gallium arsenide
1
ion channeling
1
ion microscopy
1
isotope effect
1
lithography
1
magnetic film
1
mass spectrometer
1
mass spectroscopy
1
microelectronics
1
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FFGH - Electron emission, field emission
66
FFGC - Electron spectroscopy
4
FGGJ - Ion beam analysis, ion beam solid interaction
3
TPA - Thermionics - general
3
FFPE - Thin film electronic properties, semiconductor interfaces
2
FGM - Microelectronic technology
2
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FHJ - Scanning electron microscopy, analytical electron microscopy
2
FJCK - Electrical conduction in solid materials
2
CUSE - Raman spectroscopy
1
CUW - Mass spectroscopy
1
ETC - Energy conversion
1
FAAB - Solid state physics - reference books
1
FHE - Imaging methods in materials characterization
1
FHEG - Tunneling microscopy, force microscopy
1
FHEH - Ion microscopy
1
FJLB - Physics of semiconductor devices
1
FKGM - Magnetic films
1
TBF - Semiconductor devices
1
THT - Vacuum technique
1
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