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Secondary ion mass spectrometry: a practical handbook for depth profiling and bulk impurity analysis.
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Secondary ion mass spectroscopy : principles and applications.
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Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.
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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
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Materials analysis by ion channeling : submicron crystallography /
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Backscattering spectrometry /
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Ion beam handbook for material analysis /
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