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Sputtering of indium under polyatomic ion bombardment [E-Book] /
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Secondary ion mass spectroscopy : principles and applications.
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Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
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Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /
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Secondary ion mass spectrometry: international conference 0005: proceedings : SIMS 0005: proceedings : Washington, DC, 30.09.1985-04.10.1985.
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Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
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Applied atomic collision physics. 4. Condensed matter.
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Datz, S.
1983
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Microbeam analysis. 1982 : Annual Conference of the Microbeam Analysis Society. 0017 : Washington, DC, 09.08.1982-13.08.1982.
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Secondary ion mass spectrometry: international conference 0002 : SIMS 0002 : Stanford, CA, 27.08.79-31.08.79.
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Mikroanalyse mit Elektronen- und Ionensonden /
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Quantitative Bestimmung der Sekundärionenausbeuten sauerstoffbedeckter Metalle.
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