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Benninghoven, A.
8
Mayer, James W.
5
Ziegler, J. F.
4
Datz, S.
3
Gibson, W. M.
3
Kumakhov, M. A.
3
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Andersen, Hans Henrik
2
Archard, Geoffry D.
2
Arifov, Ubal Arifovich
2
Briggs, D.
2
Brümmer, Otto
2
Bulgakov, Yu. V.
2
Etzkorn, H. W.
2
Gibbons, J. F.
2
Johnson, W. S.
2
Komarov, F. F.
2
Littmark, U.
2
Mylroie, S. W.
2
Nastasi, M.
2
Romig, A. D.
2
Sebe, T.
2
Sigmund, P.
2
Tesmer, Joseph R.
2
Tolk, N. H.
2
Vickerman, John C.
2
Wang, Yongqiang
2
Ziegler, James F.
2
Andersen, Christian A.
1
Andersen, Sven Lilledal
1
Armstrong, John T.
1
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ion beam solid interaction
15
channeling
14
ion beam analysis
12
SIMS (secondary ion mass spectroscopy)
11
desorption
8
atomic collision
7
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electron microprobe analysis
7
sputtering
7
ion scattering
6
backscattering
5
ion channeling
5
ion surface collision
5
radiation damage
5
ion irradiation
4
stopping power
4
surface analysis
4
Auger electron spectroscopy
3
accelerator
3
activation analysis
3
charged particle
3
energy loss
3
instrumentation
3
ion implantation
3
ion microprobe analysis
3
ion source
3
radiology
3
thin film
3
computer simulation
2
cross section
2
electron spectroscopy
2
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FGGJ - Ion beam analysis, ion beam solid interaction
143
FAAB - Solid state physics - reference books
16
FHJC - Microbeam analysis
16
FGGB - Ion implantation, ion beam synthesis
14
FGG - Ion beam technology
9
FHAB - Surface and thin film characterization
8
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CUW - Mass spectroscopy
3
FFGC - Electron spectroscopy
3
FFGH - Electron emission, field emission
3
FFJ - Surface structure, gas solid interface
3
CUH - Luminescence, fluorescence analysis
2
FANE - Computational solid state physics
2
FDF - Radiation effects in solids
2
FGGE - Ion beam surface modification
2
FGJ - Laser and electron beam processing
2
CBRH - Inorganic clusters
1
CTYR - Microanalysis
1
FAF - Materials research - comprehensive works
1
FDFC - Radiation effects in metals, nuclear radiation effects
1
FFPG - Multilayer systems, quantum structures
1
FHA - Materials characterization - general aspects
1
FHEE - X-ray microscopy, surface topography
1
FHEG - Tunneling microscopy, force microscopy
1
FHGE - Electron diffraction
1
FJCK - Electrical conduction in solid materials
1
FJKB - Elemental semiconductors
1
FLE - Superconductor materials
1
PGLJ - Plasma wall interaction, divertors
1
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