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FCAB - X-ray crystallography, X-ray diffraction
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FCAB - X-ray crystallography, X-ray diffraction
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1
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Einfluß von Passivierung und von Legierungszusätzen auf die thermischen Spannungen von Leiterbahnen in integrierten Schaltkreisen [E-Book] /
Nielen, Heiko
1998
“
...
FGMH
-
Metallization
,
physics
of
microelectronics
...
”
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2
E-Book
Elastisches und plastisches Verhalten passivierter Leiterbahnen in integrierten Schaltkreisen: FEM-Rechnungen und röntgenographische Spannungsmessungen [E-Book] /
Eppler, Ingo
1998
“
...
FGMH
-
Metallization
,
physics
of
microelectronics
...
”
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Available as
Electronic Edition
2
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Book
2
Type of Literature
Theses
2
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ZB
2
Name
Eppler, Ingo
1
Nielen, Heiko
1
Subject
X-ray diffraction
2
alloy
2
integrated circuit
2
microelectronics
2
thermal stress
2
Classification
FCAB - X-ray crystallography, X-ray diffraction
FGMH - Metallization, physics of microelectronics
2
FMH - Thermomechanical treatment, precipitations, recrystallization, texture
2
Language
German
2
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