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1
Book
Electromigration and electronic device degradation /
Christou, Aris
1994
“
...
FGMH
-
Metallization
,
physics
of
microelectronics
...
”
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IBN-3-4
Name
Christou, Aris
1
Subject
degradation
1
electromigration
1
failure
1
integrated circuit
1
metallization
1
semiconductor
1
more ...
temperature dependence
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FGMH - Metallization, physics of microelectronics
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