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1
E-Book
Mechanische Spannungen und Elektromigration in passivierten Leiterbahnen [E-Book] /
Roths, Christoph
1998
“
...
FGMH
-
Metallization
,
physics
of
microelectronics
...
”
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2
Book
Materials reliability in microelectronics. 6 : symposium held April 8-12.1996, San Francisco, California, USA /
Filter, William F.
1997
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FGMH
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Metallization
,
physics
of
microelectronics
...
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3
Book
Materials reliability in microelectronics. 5 : symposium San-Francisco, CA, 17.04.95-21.04.95.
Oates, A. S.
1995
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FGMH
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Metallization
,
physics
of
microelectronics
...
”
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IFF
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Name
Filter, William F.
1
Oates, A. S.
1
Roths, Christoph
1
Subject
electromigration
3
mechanical stress
microelectronics
2
reliability
2
failure
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metallization
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microstructure
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modeling
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packaging
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thin film
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Classification
FGMH - Metallization, physics of microelectronics
3
Language
German
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