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1
Book
Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern /
Bartsch, H.
1987
“
...
FGML
-
Characterization
of
electronic
materials
...
”
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1
Name
Bartsch, H.
Subject
electron microscopy
1
interface
1
semiconductor
1
Classification
FFPE - Thin film electronic properties, semiconductor interfaces
1
FGML - Characterization of electronic materials
1
FHGB - Conventional electron microscopy
1
Language
German
1
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