1
Defect recognition and image processing in semicondoctors 1997 : proceedings of the Seventh International Conference on Defect Recognition and Image Processing in Semiconductors : (DRIP VII) : held in Templin, Germany, 7 - 10 September 1997 /
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“...FGML - Characterization of electronic materials...”
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2
Microscopy of semiconducting materials 1991 : Conference on the microscopy of semiconducting materials: proceedings : Institute of Physics conference: proceedings : Oxford, 25.03.91-28.03.91.
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“...FGML - Characterization of electronic materials...”
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Point and extended defects in semiconductors : NATO advanced research workshop/international school of materials science and technology workshop on point, extended and surface defects in semiconductors. 0002 : Erice, 02.11.88-07.11.88 /
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Microscopy of semiconducting materials. 1989 : Royal Microscopical Society conference: proceedings : Conference on the microscopy of semiconducting materials: proceedings : Oxford, 10.04.89-13.04.89.
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Microscopy of semiconducting materials. 1987 : Oxford, 06.04.87-08.04.87.
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6
Defect recognition and image processing in III-V compounds. 0002 : International symposium on defect recognition and image processing in III-V compounds. 0002: proceedings : DRIP. 0002: proceedings : Monterey, CA, 27.04.87-29.04.87.
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7
Defects and properties of semiconductors: defect engineering : Symposium on Defects and Qualities of Semiconductors : Tokyo, 17.05.1984-18.05.1984.
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8
Microscopic identification of electronic defects in semiconductors: symposium : Spring meeting of the Materials Research Society. 1985 : San-Francisco, CA, 15.04.1985-18.04.1985.
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“...FGML - Characterization of electronic materials...”
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Microscopy of semiconducting materials. 1985 : Proceedings : Oxford, 25.03.1985-27.03.1985.
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10
Defect recognition and image processing in III-V compounds : Proceedings of the international symposium : Drip. 1985 : Montpellier, 02.07.1985-04.07.1985.
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Defect complexes in semiconductor structures : proceedings of the international school : Matrafüred, 13.09.82-17.09.82.
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Giber, J.
1983
“...FGML - Characterization of electronic materials...”
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12
Microscopy of semiconducting materials 1983 : Invited and contributed papers : Oxford, 21.03.83-23.03.83.
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Grain boundaries in semiconductors. 1981 : Materials Research Society annual meeting : Boston, MA, 16.11.81-19.11.81.
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Microscopy of semiconducting materials. 1981 : Proceedings of the Royal Microscopical Soc. Conference, Oxford, 6.-10.4.1981.
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