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1
Book
Microscopy of semiconducting materials 1991 : Conference on the microscopy of semiconducting materials: proceedings : Institute of Physics conference: proceedings : Oxford, 25.03.9...
Cullis, A. G.
1991
“
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FGML
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Characterization
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electronic
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...
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2
Book
Microscopy of semiconducting materials. 1989 : Royal Microscopical Society conference: proceedings : Conference on the microscopy of semiconducting materials: proceedings : Oxford,...
Cullis, A. G.
1989
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Characterization
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3
Book
Evaluation of advanced semiconductor materials by electron microscopy : NATO advanced research workshop on the evaluation of advanced semiconductor materials by electron microscopy...
Cherns, D.
1989
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4
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Microscopy of semiconducting materials. 1987 : Oxford, 06.04.87-08.04.87.
Cullis, A. G.
1987
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5
Book
Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern /
Bartsch, H.
1987
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Available as
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5
Material Type
Book
5
Type of Literature
Conference Publication
4
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1
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ZB
5
Name
Cullis, A. G.
3
Bartsch, H.
1
Cherns, D.
1
Subject
electron microscopy
semiconductor
5
interface
1
materials characterization
1
Classification
FGML - Characterization of electronic materials
5
FHG - Electron microscopy
4
FJHE - Defects and radiation effects in semiconductors
3
FFPE - Thin film electronic properties, semiconductor interfaces
1
FHGB - Conventional electron microscopy
1
Language
English
1
German
1
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