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Materialien der Elektronik und Energietechnik : Halbleiter, Graphen, funktionale Materialien /
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Semiconductor nanostructures /
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Semiconductor material and device characterization /
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Semiconductor material and device characterization /
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Diagnostic techniques for semiconductor materials processing: symposium : MRS fall meeting 1993 : Boston, MA, 29.11.93-02.12.93.
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Growth, processing, and characterization of semiconductor heterostructures: symposium : MRS fall meeting 1993: symposium M: proceedings : Boston, MA, 29.11.93-01.12.93.
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Gumbs, G.
1994
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Optical characterization of semiconductors : infrared, raman, and photoluminescence spectroscopy.
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The spectroscopy of semiconductors /
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Analysis of microelectronic materials and devices.
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Growth and characterisation of semiconductors : papers contributing to a short course /
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Semiconductor material and device characterization /
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Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
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The electrical characterization of semiconductors : measurement of minority carries properties.
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14
Evaluation of advanced semiconductor materials by electron microscopy : NATO advanced research workshop on the evaluation of advanced semiconductor materials by electron microscopy: proceedings : Bristol, 12.09.88-17.09.88 /
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Cherns, D.
1989
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Electrical characterization of gaas materials and devices.
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