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semiconducting film
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1
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Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
Brillson, L. J.
1990
“
...
FGML
-
Characterization
of
electronic
materials
...
”
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Select result number 2
2
Book
Characterization of semiconductor materials /
Kane, Philip F.
1970
“
...
FGML
-
Characterization
of
electronic
materials
...
”
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Brillson, L. J.
1
Kane, Philip F.
1
Larrabee, Graydon B.
1
Subject
semiconducting film
materials characterization
1
microelectronics
1
semiconductor interface
1
surface analysis
1
Classification
FGML - Characterization of electronic materials
2
FHAB - Surface and thin film characterization
1
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