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Materialien der Elektronik und Energietechnik : Halbleiter, Graphen, funktionale Materialien /
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Spectroscopy of semiconductors : numerical analysis bridging quantum mechanics and experiments /
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Lu, Wei
2018
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Semiconductor material and device characterization /
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Semiconductor material and device characterization /
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Optical characterization of semiconductors : infrared, raman, and photoluminescence spectroscopy.
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The spectroscopy of semiconductors /
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Microscopy of semiconducting materials 1991 : Conference on the microscopy of semiconducting materials: proceedings : Institute of Physics conference: proceedings : Oxford, 25.03.91-28.03.91.
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Growth and characterisation of semiconductors : papers contributing to a short course /
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Point and extended defects in semiconductors : NATO advanced research workshop/international school of materials science and technology workshop on point, extended and surface defects in semiconductors. 0002 : Erice, 02.11.88-07.11.88 /
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Semiconductor material and device characterization /
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The electrical characterization of semiconductors : measurement of minority carries properties.
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Microscopy of semiconducting materials. 1989 : Royal Microscopical Society conference: proceedings : Conference on the microscopy of semiconducting materials: proceedings : Oxford, 10.04.89-13.04.89.
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Evaluation of advanced semiconductor materials by electron microscopy : NATO advanced research workshop on the evaluation of advanced semiconductor materials by electron microscopy: proceedings : Bristol, 12.09.88-17.09.88 /
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Cherns, D.
1989
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Photoacoustic and thermal wave phenomena in semiconductors /
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Microscopy of semiconducting materials. 1987 : Oxford, 06.04.87-08.04.87.
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Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern /
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