JuLib | Books & more - {"FGML - Characterization of electronic materials"}

VuFind

0 Items in e-Shelf (Full)
History
User Account
Logout
User Account
Help
- English
- Deutsch

Books & more
Articles & more
JuSER

Advanced

Ask a Librarian

Books & more: Hits 41 - 60 of 77

sort by

Select all titles on this page

Select result number 41

E-Book

Anwendung der hochauflösenden Elektronenenergieverlustspektroskopie zum Studium von Halbleiterschichtsystemen [E-Book] /

Förster, Arnold
1988

“...FGML - Characterization of electronic materials...”

Full text JuSER

Favorites

Saved in:

QR Code

Select result number 42

Book

Photoacoustic and thermal wave phenomena in semiconductors /

Mandelis, Andreas.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 43

Book

Diagnostic techniques in VLSI fabrication : SEMICON/West, May 19-21, 1987, San Mateo, California /

1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 44

Book

International conference on raman and luminescence spectroscopy in technology: proceedings : Annual international technical symposium on optical and optoelectronic applied science...

Griffiths, J. E.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 45

Book

Microscopy of semiconducting materials. 1987 : Oxford, 06.04.87-08.04.87.

Cullis, A. G.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 46

Book

Defect recognition and image processing in III-V compounds. 0002 : International symposium on defect recognition and image processing in III-V compounds. 0002: proceedings : DRIP....

Weber, E. R.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 47

Book

Lasers in microlithography: proceedings : Santa-Clara, CA, 02.03.87-03.03.87.

Ehrlich, D. J.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 48

Book

Modern optical characterization techniques for semiconductors and semiconductor devices: proceedings : Bay-Point, FL, 26.03.87-27.03.87.

Glembocki, O. J.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 49

Book

Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern /

Bartsch, H.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 50

Book

Ultrafast lasers probe phenomena in bulk and microstructure semiconductors: proceedings : Bay-Point, FL, 25.03.87-26.03.87 /

Alfano, Robert R.
1987

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 51

Book

Defects and properties of semiconductors: defect engineering : Symposium on Defects and Qualities of Semiconductors : Tokyo, 17.05.1984-18.05.1984.

Chikawa, J.
1986

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 52

Book

Microelectronics processing : Inorganic materials characterization. developed from a symposium.

Casper, L. A.
1986

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 53

Book

Advanced processing and characterization of semiconductors. 3 : Los-Angeles, CA, 22.01.1986-24.01.1986 /

Sadana, D. K.
1986

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 54

Book

Mess- und Prüftechnik.

Zerbst, M.
1986

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 55

Book

Laser processing and diagnostics. 2. European Materials Research Society : spring meeting. 1986 : Strasbourg, 17.06.1986-20.06.1986 /

Bäuerle, Dieter
1986

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 56

Book

Spectroscopic characterization techniques for semiconductor technology. 2 : Los-Angeles, CA, 21.01.1985-22.01.1985 /

Pollak, F. H.
1985

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 57

Book

Microscopic identification of electronic defects in semiconductors: symposium : Spring meeting of the Materials Research Society. 1985 : San-Francisco, CA, 15.04.1985-18.04.1985.

Johnson, N. M.
1985

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 58

Book

Microscopy of semiconducting materials. 1985 : Proceedings : Oxford, 25.03.1985-27.03.1985.

Cullis, A. G.
1985

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 59

Book

Defect recognition and image processing in III-V compounds : Proceedings of the international symposium : Drip. 1985 : Montpellier, 02.07.1985-04.07.1985.

Fillard, J. P.
1985

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select result number 60

Book

Internationales wissenschaftliches Kolloquium / Technische Hochschule Ilmenau. 29,5. Vortragsreihe B3 / B4, Werkstoffprobleme der Mikroelektronik und ihre Analysemethoden : Ilmenau...

1984

“...FGML - Characterization of electronic materials...”

Call number: Loading...
Located: Loading...

Literature Request

Loan/Reservation

Favorites

Saved in:

QR Code

Select all titles on this page

Narrow Search Results

Print Edition 68 Electronic Edition 9

Book 77

Conference Publication 38 Theses 11 Handbook, Textbook 4

From:

To:

ZB 75 IFF 2 IKP 2 IBN-1-2 1 IBN-3-4 1 IEK-14 1 more ... IEK-5 1 see all ... less ...

Cullis, A. G. 6 Alfano, Robert R. 3 Schroder, Dieter K. 3 Bäuerle, Dieter 2 Chekol, Solomon Amsalu 2 Cüppers, Felix Johannes 2 more ... Glembocki, O. J. 2 Marcus, R. B. 2 Sadana, D. K. 2 Balzarotti, A. 1 Bartsch, H. 1 Bauer, G. 1 Benedek, G. 1 Bimberg, Dieter 1 Blood, P. 1 Brillson, L. J. 1 Casper, L. A. 1 Chen, J. 1 Cherns, D. 1 Chikawa, J. 1 Donecker, J. 1 Ehrenberg, W. 1 Ehrlich, D. J. 1 Eisebitt, Stefan 1 Fasol, G. 1 Fillard, J. P. 1 Fu, Ying 1 Förster, Arnold 1 Gibbons, D. J. 1 Giber, J. 1 see all ... less ...

semiconductor 16 materials characterization 15 electron microscopy 5 semiconductor device 5 III - V semiconductor 4 defect analysis 4 more ... electronic device 4 neural network (computing) 4 semiconductor processing 4 epitaxy 3 image processing 3 laser processing 3 microelectronics 3 nanostructures 3 optical properties 3 optical spectroscopy 3 quantum dot 3 semiconductor heterostructure 3 thin film 3 Monte Carlo method 2 Raman spectroscopy 2 circuit theory 2 electronic properties 2 filament 2 graphene 2 hardware 2 laser beam solid interaction 2 photoluminescence 2 relaxation time 2 semiconducting film 2 see all ... less ...

FGML - Characterization of electronic materials 77 FJHE - Defects and radiation effects in semiconductors 14 FJNC - Optical spectroscopy in solids 11 FHG - Electron microscopy 7 FFPE - Thin film electronic properties, semiconductor interfaces 6 FAF - Materials research - comprehensive works 5 more ... FGK - Thin film technology, epitaxy 5 FJLB - Physics of semiconductor devices 5 FJKC - III - V semiconductors 4 CUME - Picosecond phenomena 3 FGJ - Laser and electron beam processing 3 FHA - Materials characterization - general aspects 3 FHAB - Surface and thin film characterization 3 FJNH - Excited states in solids 3 CUH - Luminescence, fluorescence analysis 2 FFPG - Multilayer systems, quantum structures 2 FGCD - Crystal growth of specific substances 2 FGM - Microelectronic technology 2 FHCF - Defect characterization 2 FHGB - Conventional electron microscopy 2 FJC - Electronic properties of solids 2 FJKB - Elemental semiconductors 2 FKG - Magnetic materials 2 CUA - Spectroscopy 1 CUSE - Raman spectroscopy 1 EBA - Energy production, energy technology 1 EIS - Solar cells 1 FEAH - Ordering and dynamical processes in condensed matter 1 FEJH - Low dimensional materials, intercalation compounds 1 FFG - Surface electronic effects 1 see all ... less ...

English 18 German 8

Forschungszentrum Jülich
Central Library (ZB)