ZB 67 IBN-1-2 3 IBN-3-4 3 IEK-4 3 IEK-1 2 IEK-14 2 more ... IFF 2 IEK-11 1 IEK-13 1 IEK-3 1 IEK-5 1 PGI-8 1 see all ... less ...

Richardson, J. H. 4 Lemaitre, Jean 3 Rossiter, Bryant W. 3 Barsoukov, Evgenij 2 Briggs, D. 2 Feldman, Leonard C. 2 more ... Herman, H. 2 Hua, Z. Y. 2 Mayer, James W. 2 Walls, J. M. 2 Alford, Terry L. 1 Bauer, G. 1 Bedford, Anthony 1 Brandon, David. 1 Brune, D. 1 Brümmer, Otto 1 Bubert, Henning 1 Cheetham, A. K. 1 Cojocariu, Iulia 1 Coleman, R. V. 1 Cronin, Stephen B. 1 Day, P. 1 Dresselhaus, Gene 1 Dresselhaus, Mildred 1 Dudek, Hans Joachim. 1 Ebel, Maria F. 1 Eberhart, J.-P. 1 Feygenson, Mikhail 1 Flewitt, P. E. 1 Fultz, Brent 1 see all ... less ...

materials characterization 18 surface analysis 14 thin film 9 Auger electron spectroscopy 4 X-ray diffraction 4 X-ray spectroscopy 4 more ... neutron diffraction 4 Mössbauer spectroscopy 3 electron diffraction 3 electron microscopy 3 impedance spectroscopy 3 materials science 3 modeling 3 semiconductor 3 solid state spectroscopy 3 LEED (low energy electron diffraction) 2 NMR (nuclear magnetic resonance) 2 Raman spectroscopy 2 activation analysis 2 chemical analysis 2 coating 2 composite materials 2 crystal 2 diffraction 2 electrode process 2 electron microprobe analysis 2 emission spectroscopy 2 magnetic resonance 2 metal organic compound 2 metal surface 2 see all ... less ...

FHAB - Surface and thin film characterization 34 FHA - Materials characterization - general aspects 33 FFGC - Electron spectroscopy 3 FGGJ - Ion beam analysis, ion beam solid interaction 3 FHC - Diffraction methods in materials characterization 3 CNRO - Electrode processes 2 more ... CUK - X-ray spectroscopy 2 FFP - Physics of thin films 2 FGML - Characterization of electronic materials 2 FGN - Nanotechnology 2 FHCB - X-ray scattering 2 FHE - Imaging methods in materials characterization 2 FHG - Electron microscopy 2 CBM - Inorganic synthesis and reactions of the elements and their compounds - general aspects 1 CEN - Metal organic compounds - synthesis and reactions 1 CTYR - Microanalysis 1 CUKF - X-ray fluorescence analysis 1 EBA - Energy production, energy technology 1 FAF - Materials research - comprehensive works 1 FCAB - X-ray crystallography, X-ray diffraction 1 FCB - Crystal chemistry 1 FCG - Lattice dynamics 1 FFA - Surface science, surface physics - general aspects 1 FFJB - Surface dynamics 1 FGCD - Crystal growth of specific substances 1 FHAB - Surface and thin film characterization 1 FHCH - Microstructural analysis 1 FHEE - X-ray microscopy, surface topography 1 FHGE - Electron diffraction 1 FHTD - Mössbauer spectroscopy 1 see all ... less ...

English 16 German 2