Richardson, J. H. 4 Baruchel, J. 3 Herman, H. 3 Lemaitre, Jean 3 Blab, Marcus 2 Che, Michael 2 more ... Danzer, K. 2 Day, P. 2 Kichin, Georgy 2 Korte, Stefan 2 Lifshin, E, 2 Passaglia, E. 2 Pavesi, Lorenzo 2 Rossiter, Bryant W. 2 Zheng, Fengshan 2 Aly, Monir M. 1 Bai, Chenguang 1 Balzarotti, A. 1 Bedford, Anthony 1 Bennet, L. H. 1 Beske, H. 1 Bethge, Klaus 1 Biest, O. van der 1 Birnbaum, H. K. 1 Bishay, Adli 1 Borsali, Redouane 1 Brandon, David. 1 Brümmer, Otto 1 Buresch, O. 1 Cahn, Robert W. 1 see all ... less ...

materials characterization 38 solid state spectroscopy 10 neutron scattering 8 Mössbauer spectroscopy 7 X-ray diffraction 7 electron microscopy 7 more ... neutron diffraction 6 scanning tunneling microscopy 6 surface analysis 6 synchrotron radiation 6 electron microprobe analysis 5 transmission electron microscopy 5 NMR (nuclear magnetic resonance) 4 X-ray spectroscopy 4 activation analysis 4 charge transport 4 condensed matter 4 electron diffraction 4 microscopy 4 modeling 4 optical properties 4 scanning electron microscopy 4 Auger electron spectroscopy 3 X-ray fluorescence analysis 3 defect analysis 3 gas chromatography 3 graphene 3 holography 3 magnetic resonance 3 mass spectroscopy 3 see all ... less ...

FHA - Materials characterization - general aspects 115 FAF - Materials research - comprehensive works 9 FHE - Imaging methods in materials characterization 9 FHCF - Defect characterization 6 FHEG - Tunneling microscopy, force microscopy 6 FHN - Neutron scattering 5 more ... CUA - Spectroscopy 4 FGN - Nanotechnology 4 FHAB - Surface and thin film characterization 4 FHL - Synchrotron radiation techniques 4 FME - Metallurgical investigation methods - surveys, general aspects 4 FDF - Radiation effects in solids 3 FGML - Characterization of electronic materials 3 FHCB - X-ray scattering 3 CTF - Chemical analytical methods 2 CUK - X-ray spectroscopy 2 CUO - Molecular spectroscopy 2 FCB - Crystal chemistry 2 FGC - Crystal growth, crystal technology 2 FHC - Diffraction methods in materials characterization 2 FHEE - X-ray microscopy, surface topography 2 FHG - Electron microscopy 2 FHTD - Mössbauer spectroscopy 2 FJNC - Optical spectroscopy in solids 2 FNM - High temperature materials, high temperature properties 2 FNN - Ceramics - general aspects 2 FNPE - Nanostructured materials 2 FNX - Carbon, carbon materials 2 TGH - Technical optics 2 CBM - Inorganic synthesis and reactions of the elements and their compounds - general aspects 1 see all ... less ...

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