1
Optical characterization of epitaxial semiconductor layers.
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Bauer, G.
1996
“...FHAB - Surface and thin film characterization...”
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2
Analysis of microelectronic materials and devices.
Book
“...FHAB - Surface and thin film characterization...”
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3
Surface and interface analysis of microelectronic materials processing and growth: meeting: proceedings : Santa-Clara, CA, 12.10.89-13.10.89.
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“...FHAB - Surface and thin film characterization...”
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