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Morphologie und Energetik kleiner Bleikristalle untersucht mit Rastertunnel- und Rasterelektronenmikroskopie [E-Book] /
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Handbook of surfaces and interfaces of materials. 2. Surface and interface analysis of properties /
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Handbook of surfaces and interfaces of materials. 4. Solid thin films and layers /
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Introduction to surface and thin film processes /
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Metal clusters at surfaces : structure, quantum properties, physical chemistry /
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Entwicklung eines Rastertunnelmikroskops in Kombination mit einer Anlage zur Molekularstrahlepitaxie und Photoemissionsspektroskopie [E-Book]/
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Epitaktisches Wachstum und strukturelle, elektrische und optische Charakterisierung von Ru2Si3-Schichten [E-Book] /
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Plasmagestützte Abscheidung und Charakterisierung von dünnen mehrphasigen Schichten [E-Book] /
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Untersuchungen an reinen und mit Wasserstoff bedeckten SiC(100)- Oberflächen mit hochauflösender Elektronenenergieverlustspektroskopie [E-Book] /
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Plasmaabscheidung von mikrokristallinem Silizium : Merkmale und Mikrostruktur und deren Deutung im Sinne von Wachstumsvorgängen [E-Book] /
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Characterization of nanophase materials /
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Introduction to surface roughness and scattering /
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Polymers at surfaces and interfaces /
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Rastertunnelmikroskopie an III-V-Halbleitern : Nanostrukturierung und lokal angeregte Lumineszenz /
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Photoelektronische Messungen mit der Rastersondenmikroskopie zur Mikroanalyse reiner und modifizierter Halbleiteroberflächen im Elektrolyten [E-Book] /
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Rastertunnelmikroskopische und -spektroskopische Untersuchungen an strukturierten Ge/Si(111)-Oberflächen [E-Book] /
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Untersuchungen zum Verhalten nanokristalliner Metallpartikel auf Si mit dem Rastertunnelmikroskop /
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Self-organized processes in semiconductor alloys : [Symposium I, Self-Organized Processes in Semiconductor Alloys - Spontaneous Ordering, Composition Modulation, and 3-D Islanding] held November 29 - December 2, 1999, Boston, Massachusetts, USA [ at the 1999 MRS fall meeting] /
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Surface and near-surface analysis of materials : proceedings of Topical Symposium II - "Surface and Near-Surface Analysis of Materials" of the Forum on New Materials of the 9th CIMTEC - World Congress and Forum on New Materials : Florence, Italy June 14-19, 1998 /
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Strukturelle Charakterisierung von Grenzflächen und Korngrenzen in CVD-Diamantfilmen auf Silizium-Substraten mittels hochauflösender Verfahren der Transmissionselektronenmikroskopie [E-Book] /
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