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Applied RHEED : reflection high-energy electron diffraction during crystal growth /
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Microstructural characterization of materials /
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Structural and residual stress analysis by nondestructive methods : evaluation - application - assessment /
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Diffraction physics /
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Atlas of backscattering Kikuchi diffraction patterns /
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Introduction to radiometry and photometry.
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Applications of multiple scattering theory to materials science: symposium: proceedings : Boston, MA, 02.12.91-05.12.91.
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International tables for crystallography. C. Mathematical, physical and chemical tables.
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Advances in surface and thin film diffraction : Advances in surface and thin film diffraction: symposium: proceedings : Materials Research Society meeting. 1990 : Boston, MA, 27.11.90-29.11.90.
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Structural and chemical analysis of materials : X-ray, electron and neutron diffraction; X-ray, electron and ion spectrometry; electron microscopy /
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Structure analysis by small-angle x-ray and neutron scattering /
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Diffraction from materials /
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Diffraction physics
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Röntgenbeugung und Elektronenbeugung : Grundlagen und Anwendungen in der Rohstoffkontrolle und Produktkontrolle.
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Steeb, S.
1985
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Diffraction for materials scientists /
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Diffraction and imaging techniques in material science. 1. Electron microscopy : diffraction and imaging techniques : summer school : proceedings : Antwerpen, 28.07.69-08.08.69 /
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Diffraction and imaging techniques in material science. 2. Imaging and diffraction techniques : diffraction and imaging techniques : summer school : proceedings : Antwerpen, 28.07.69-08.08.69 /
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Diffraction physics.
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Advances in structure research by diffraction methods. 6.
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Hoppe, W.
1975
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Advances in structure research by diffraction methods. 5.
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Hoppe, W.
1974
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