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1
E-Book
Charakterisierung von Nanometer-Partikeln mit Hilfe elektrochemischer in-situ Rastertunnelmikroskopie [E-Book] /
Breuer, Norbert
1995
“
...
FHEG
-
Tunneling
microscopy
,
force
microscopy
...
”
1
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Name
Breuer, Norbert
Subject
electrochemistry
1
nanostructures
1
particle
1
scanning tunneling microscopy
1
Classification
FHEG - Tunneling microscopy, force microscopy
1
Language
German
1
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