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FJHE - Defects and radiation effects in semiconductors
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FJHE - Defects and radiation effects in semiconductors
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1
E-Book
Untersuchung der Kristallgitterdefekte und der Kompensationsmechanismen in hoch siliziumdotiertem GaAs mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Domke, Christiane
1998
“
...
FHEG
-
Tunneling
microscopy
,
force
microscopy
...
”
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2
E-Book
Quantitative Untersuchung von Defekten auf Oberflächen von III-V-Verbindungshalbleitern mit dem Rastertunnelmikroskop [E-Book] /
Ebert, Philipp
1993
“
...
FHEG
-
Tunneling
microscopy
,
force
microscopy
...
”
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3
E-Book
Untersuchungen von Grenzflächen und Gitterbaufehlern in Galliumarsenid mit Hilfe der Rastertunnelmikroskopie [E-Book] /
Cox, Gerhard
1990
“
...
FHEG
-
Tunneling
microscopy
,
force
microscopy
...
”
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Available as
Electronic Edition
3
Material Type
Book
3
Type of Literature
Theses
3
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Location
ZB
3
Name
Cox, Gerhard
1
Domke, Christiane
1
Ebert, Philipp
1
Subject
scanning tunneling microscopy
3
gallium arsenide
2
III - V semiconductor
1
defect
1
dislocation
1
silicon
1
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surface defect
1
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Classification
FHEG - Tunneling microscopy, force microscopy
3
FJHE - Defects and radiation effects in semiconductors
FJKC - III - V semiconductors
2
FFJ - Surface structure, gas solid interface
1
Language
German
3
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