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Select result number 1
1
Book
Light element analysis in the transmission electron microscope: WEDX and EELS.
Budd, P. M.
1988
“
...
FHGB
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Conventional
electron
microscopy
...
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2
Book
Elektronenmikroskopische Querschnittsabbildung von Interfaces und Heterostrukturen in Halbleitern /
Bartsch, H.
1987
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FHGB
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Conventional
electron
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3
Book
Analytische Transmissionselektronenmikroskopie /
Bauer, H. D.
1986
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FHGB
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Conventional
electron
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4
Book
Thin foil preparation for electron microscopy /
Goodhew, Peter J.
1985
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FHGB
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Conventional
electron
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5
Book
The operation of the transmission electron microscope.
Chescoe, D.
1984
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Conventional
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6
Book
Specimen preparation for transmission electron microscopy of materials.
Goodhew, Peter J.
1984
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7
Book
Metallurgical microscopy.
Modin, H.
1973
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Conventional
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8
Book
Manual on electron metallography techniques.
Maniar, G. N.
1973
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Conventional
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9
Book
Elektronenmikroskopische Untersuchungs- und Präparationsmethoden.
Reimer, Ludwig.
1967
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FHGB
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Conventional
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10
Book
Einführung in die Elektronenmikroskopie /
Picht, Johannes.
1966
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11
Book
Einführung in die Elektronenmetallographie: Eisen und Stahl.
Nestler, Carl-Georg.
1961
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FHGB
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Conventional
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Available as
Print Edition
11
Material Type
Book
11
Type of Literature
Handbook, Textbook
Year of Publication
From:
To:
Location
ZB
9
IFF
2
IBN-1-2
1
Name
Goodhew, Peter J.
4
Baker, T. J.
1
Bartsch, H.
1
Bauer, H. D.
1
Budd, P. M.
1
Chescoe, D.
1
more ...
Heydenreich, Johannes.
1
Maniar, G. N.
1
Modin, H.
1
Modin, S.
1
Nestler, Carl-Georg.
1
Picht, Johannes.
1
Reimer, Ludwig.
1
see all ...
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Subject
transmission electron microscopy
3
sample preparation
2
EDAX (energy dispersion X-ray analysis)
1
electron diffraction
1
electron energy loss spectroscopy
1
electron microscopy
1
more ...
electron spectroscopy
1
interface
1
metallography
1
semiconductor
1
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Classification
FHGB - Conventional electron microscopy
11
FMGH - Metallographic microscopy, metallographic stereology
3
FFGC - Electron spectroscopy
1
FFPE - Thin film electronic properties, semiconductor interfaces
1
FGML - Characterization of electronic materials
1
FHEC - Optical microscopy in materials characterization
1
more ...
FHG - Electron microscopy
1
FHJ - Scanning electron microscopy, analytical electron microscopy
1
FHJC - Microbeam analysis
1
FMGE - Metallographic specimen preparation
1
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Language
German
2
English
1
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