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Modern methods of specimen preparation for TEM including focused ion beam (FIB) [E-Book] : proceedings of the 1st Summer School on Advanced Electron Microscopy, 30.6. - 5.7.2003, Krakow, Polen / /
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Introduction to conventional transmission electron microscopy /
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Specimen preparation for transmission electron microscopy of materials. 4 : symposium held April 2, 1997, San Francisco, California, USA /
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Specimen preparation for transmission electron microscopy of materials. 3: symposium : MRS specimen preparation workshop . 3 : Boston, MA, 05.12.91-06.12.91 /
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The system zirconium/cobalt/hydrogen: a transmission electron microscopy study [E-Book] /
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Specimen preparation for transmission electron microscopy of materials. 2: symposium : MRS specimen preparation workshop : San-Francisco, CA, 19.04.90-20.04.90 /
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Thin foil preparation for electron microscopy /
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Electron microscopy of thin crystals : summer school held in Cambridge in July 1963 /
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