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Modern methods of specimen preparation for TEM including focused ion beam (FIB) [E-Book] : proceedings of the 1st Summer School on Advanced Electron Microscopy, 30.6. - 5.7.2003, Krakow, Polen / /
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Introduction to conventional transmission electron microscopy /
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Entwicklung einer niederenergetischen Flüssigmetall-Rasterionensonde für die in-situ Ionenätzung im Transmissionselektronenmikroskop (TEM) /
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Untersuchungen zum epitaktischen Wachstum in Stranski-Kastranow-Systemen mittels quantitativer Methoden der Transmissionselektronenmikroskopie [E-Book] /
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Specimen preparation for transmission electron microscopy of materials. 4 : symposium held April 2, 1997, San Francisco, California, USA /
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Elektronenmikroskopische Charakterisierung von Versetzungen in plastisch verformtem InP [E-Book] /
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Specimen preparation for transmission electron microscopy of materials. 3: symposium : MRS specimen preparation workshop . 3 : Boston, MA, 05.12.91-06.12.91 /
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The system zirconium/cobalt/hydrogen: a transmission electron microscopy study [E-Book] /
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Transmission electron microscopy of minerals and rocks.
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The operation of transmission and scanning electron microscopes.
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Specimen preparation for transmission electron microscopy of materials. 2: symposium : MRS specimen preparation workshop : San-Francisco, CA, 19.04.90-20.04.90 /
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Specimen preparation for transmission electron microscopy of materials: symposium : Boston, MA, 03.12.87.
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TEM/TED studies of epitaxial layers of ternary and quaternary group III-V compound semiconductor alloys.
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Specimen preparation for transmission electron microscopy of materials.
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The operation of the transmission electron microscope.
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Transmission electron microscopy : physics of image formation and microanalysis
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Reimer, L.
1984
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Manual on electron metallography techniques.
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Advances in electron metallography vol 0006 : Symposium on advances in electron metallography: papers : Annual meeting of the American Society for Testing and Materials 0068 : Lafayette, IN, 13.06.65-18.06.65.
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1966
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Techniques of electron microscopy, diffraction, and microprobe analysis : Annual meeting of the American Society for Testing and Materials 0066 : Symposium on electron metallography: papers : Atlantic-City, NJ, 26.06.63.
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1964
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Symposium on advances in techniques in electron metallography: papers : Annual meeting of the American Society for Testing and Materials 0065 : New-York, NY, 26.06.62.
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1963
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