ZB 46 IFF 5 IAS-9 1 IBN-1-2 1

Goodhew, Peter J. 5 Thomas, G. 4 Edington, Jeffrey William. 3 Anderson, Ron M. 2 Chescoe, D. 2 Hirsch, Peter. 2 more ... Anderson, Ronald M. 1 Ardenne, Manfred von 1 Baker, T. J. 1 Bartsch, H. 1 Bauer, H. D. 1 Brandes, J. 1 Bravman, J. C. 1 Bravman, John 1 Bryan, Tracy 1 Budd, P. M. 1 Friedrich, J. 1 Gnauck, Peter. 1 Goringe, M. J. 1 Graef, Marc De 1 Heydenreich, Johannes. 1 Hirsch, P. B. 1 Hobbs, L. W. 1 Knowles, K. 1 Lampert, B. 1 Luysberg, Martina 1 MacLaren, A. C. 1 Maniar, G. N. 1 Marcus, R. B. 1 Modin, H. 1 see all ... less ...

transmission electron microscopy 22 sample preparation 7 metallography 6 electron microscopy 5 electron diffraction 3 III - V semiconductor 2 more ... electron microprobe analysis 2 quasicrystal 2 EDAX (energy dispersion X-ray analysis) 1 crystal defect 1 defect 1 defect analysis 1 diffraction 1 dislocation 1 electron energy loss spectroscopy 1 electron scattering 1 electron spectroscopy 1 heterostructure 1 hydrogen 1 inelastic scattering 1 interface 1 ion etching 1 metal 1 minerals 1 molecular beam epitaxy 1 plastic deformation 1 quantum mechanics 1 rock 1 scanning electron microscopy 1 semiconducting film 1 see all ... less ...

FHGB - Conventional electron microscopy 49 FMGH - Metallographic microscopy, metallographic stereology 10 FAF - Materials research - comprehensive works 4 FHG - Electron microscopy 4 FHJ - Scanning electron microscopy, analytical electron microscopy 3 FHJC - Microbeam analysis 3 more ... FFPE - Thin film electronic properties, semiconductor interfaces 2 FGKC - Vacuum deposition, MBE 2 FGML - Characterization of electronic materials 2 FHEM - Image analysis in microscopy, stereology 2 FJKC - III - V semiconductors 2 CHTR - Chemistry of mixtures 1 CHVG - Phase equilibria 1 FDCD - Dislocations 1 FDCH - Defects in metals 1 FEFJ - Quasicrystals 1 FEJB - Amorphous materials 1 FFGC - Electron spectroscopy 1 FFJ - Surface structure, gas solid interface 1 FGC - Crystal growth, crystal technology 1 FGK - Thin film technology, epitaxy 1 FHCH - Microstructural analysis 1 FHEC - Optical microscopy in materials characterization 1 FHGE - Electron diffraction 1 FJHE - Defects and radiation effects in semiconductors 1 FMGE - Metallographic specimen preparation 1 FMXG - Metal hydrogen systems - specific aspects, specific systems 1 FPGB - Plastic deformation 1 GFAD - Mineral determination 1 GHAB - Rocks - physical properties 1 see all ... less ...

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