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Goodhew, Peter J.
5
Thomas, G.
4
Edington, Jeffrey William.
3
Anderson, Ron M.
2
Chescoe, D.
2
Hirsch, Peter.
2
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Anderson, Ronald M.
1
Ardenne, Manfred von
1
Baker, T. J.
1
Bartsch, H.
1
Bauer, H. D.
1
Brandes, J.
1
Bravman, J. C.
1
Bravman, John
1
Bryan, Tracy
1
Budd, P. M.
1
Friedrich, J.
1
Gnauck, Peter.
1
Goringe, M. J.
1
Graef, Marc De
1
Heydenreich, Johannes.
1
Hirsch, P. B.
1
Hobbs, L. W.
1
Knowles, K.
1
Lampert, B.
1
Luysberg, Martina
1
MacLaren, A. C.
1
Maniar, G. N.
1
Marcus, R. B.
1
Modin, H.
1
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transmission electron microscopy
22
sample preparation
7
metallography
6
electron microscopy
5
electron diffraction
3
III - V semiconductor
2
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electron microprobe analysis
2
quasicrystal
2
EDAX (energy dispersion X-ray analysis)
1
crystal defect
1
defect
1
defect analysis
1
diffraction
1
dislocation
1
electron energy loss spectroscopy
1
electron scattering
1
electron spectroscopy
1
heterostructure
1
hydrogen
1
inelastic scattering
1
interface
1
ion etching
1
metal
1
minerals
1
molecular beam epitaxy
1
plastic deformation
1
quantum mechanics
1
rock
1
scanning electron microscopy
1
semiconducting film
1
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FHGB - Conventional electron microscopy
49
FMGH - Metallographic microscopy, metallographic stereology
10
FAF - Materials research - comprehensive works
4
FHG - Electron microscopy
4
FHJ - Scanning electron microscopy, analytical electron microscopy
3
FHJC - Microbeam analysis
3
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FFPE - Thin film electronic properties, semiconductor interfaces
2
FGKC - Vacuum deposition, MBE
2
FGML - Characterization of electronic materials
2
FHEM - Image analysis in microscopy, stereology
2
FJKC - III - V semiconductors
2
CHTR - Chemistry of mixtures
1
CHVG - Phase equilibria
1
FDCD - Dislocations
1
FDCH - Defects in metals
1
FEFJ - Quasicrystals
1
FEJB - Amorphous materials
1
FFGC - Electron spectroscopy
1
FFJ - Surface structure, gas solid interface
1
FGC - Crystal growth, crystal technology
1
FGK - Thin film technology, epitaxy
1
FHCH - Microstructural analysis
1
FHEC - Optical microscopy in materials characterization
1
FHGE - Electron diffraction
1
FJHE - Defects and radiation effects in semiconductors
1
FMGE - Metallographic specimen preparation
1
FMXG - Metal hydrogen systems - specific aspects, specific systems
1
FPGB - Plastic deformation
1
GFAD - Mineral determination
1
GHAB - Rocks - physical properties
1
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