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Aberrationskorrigierte Photoemissionsmikroskopie an magnetischen Systemen : von statischer Charakterisierung zu zeitaufgelöster Abbildung /
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Aberrationskorrigierte Photoemissionsmikroskopie an magnetischen Systemen : von statischer Charakterisierung zu zeitaufgelöster Abbildung [E-Book] /
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High-resolution electron microscoopy /
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High-resolution electron microscopy /
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High-resolution electron microscopy /
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Charakterisierung magnetischer Materialien mit X-PEEM [E-Book] /
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Untersuchungen zum atomaren Aufbau aperiodischer Objekte mittels Objektwellenrekonstruktion in der hochauflösenden Elektronenmikroskopie [E-Book] /
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Characterization of high Tc materials and devices by electron microscopy /
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Strukturelle Charakterisierung von Grenzflächen und Korngrenzen in CVD-Diamantfilmen auf Silizium-Substraten mittels hochauflösender Verfahren der Transmissionselektronenmikroskopie [E-Book] /
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High-resolution electron microscopy for materials science : D. Shindo /
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Methodische Untersuchungen zur quantitativen Bildauswertung und zur Rekonstruktion der Austrittswellenfunktion in der hochauflösenden Elektronenmikroskopie [E-Book] /
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Kompositionelle und strukturelle Charakterisierung von verspannten Si/SiGe-Heterostrukturen mit hochauflösender Transmissionselektronenmikroskopie [E-Book] /
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High resolution electron microscopy of defects in materials : Symposium on High Resolution Electron Microscopy of Defects in Materials : Spring MRS Meeting. 1990 : San-Francisco, CA, 16.04.90-18.04.90.
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High resolution microscopy of materials : Symposium on high resolution microscopy of materials: proceedings : Boston, MA, 28.11.88-03.12.88.
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High-resolution transmission electron microscopy and associated techniques /
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Experimental high-resolution electron microscopy /
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High resolution and high voltage electron microscopy /
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Bildinterpretation in der Hochauflösungselektronenmikroskopie: numerische und optische Verfahren zur Interpretation elektronenmikroskopischer Hochauflösungsabbildungen kristalliner Objekte /
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High resolution electron microscopy applied to chemical problems : Proceedings of a symposium : American Chemical Society: national meeting. 0182 : New-York, NY, 25.08.81-26.08.81.
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Eyring, L.
1982
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Electron microscopy. 1980,1. Physics : proceedings of the Seventh European Congress on Electron Microscopy : the Hague, the Netherlands, August 24-29, 1980 /
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