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Flatten, Tim
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Flatten, Tim
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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM /
Flatten, Tim
2020
“
...
FJC
-
Electronic
properties
of
solids
...
”
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Direct measurement of anisotropic resistivity in thin films using a 4-probe STM [E-Book] /
Flatten, Tim
2020
“
...
FJC
-
Electronic
properties
of
solids
...
”
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ZB
2
Name
Flatten, Tim
Subject
electron transport
2
electronic properties
2
multilayer system
2
scanning tunneling microscopy
2
thin film
2
Classification
FFPE - Thin film electronic properties, semiconductor interfaces
2
FJC - Electronic properties of solids
2
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English
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