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FEJP - Porous media, capillarity
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FEJP - Porous media, capillarity
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1
E-Book
Charakterisierung und Optimierung der Materialeigenschaften von porösem Silicium für aktive und passive optische Bauelemente [E-Book] /
Arens-Fischer, Rüdiger
2000
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Elemental
semiconductors
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Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium im Hinblick auf optische und optoelektronische Anwendungen [E-Book] /
Thönissen, Markus
1999
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Light emission from silicon : Symposium on light emission from porous silicon: proceedings : E MRS spring conference: symposium E : Strasbourg, 04.05.93-07.05.93.
Vial, J. C.
1994
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Infrarotspektroskopie an porösem Silizium und zweidimensionalen Elektronengassystemen bzw Löchergassystemen.
Mueller, Frank D.
1993
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Available as
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2
Print Edition
2
Material Type
Book
4
Type of Literature
Theses
3
Conference Publication
1
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ZB
4
Name
Arens-Fischer, Rüdiger
1
Mueller, Frank D.
1
Thönissen, Markus
1
Vial, J. C.
1
Subject
porous silicon
2
silicon
2
electron gas
1
infrared spectroscopy
1
luminescence
1
luminescent material
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optoelectronics
1
porous material
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spectroscopy
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Classification
FEJP - Porous media, capillarity
FJKB - Elemental semiconductors
4
CUA - Spectroscopy
1
CUR - Infrared spectroscopy
1
FHAB - Surface and thin film characterization
1
FJNC - Optical spectroscopy in solids
1
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FJNH - Excited states in solids
1
TBT - Optoelectronics, optical fibers, displays
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Language
German
2
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