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1
Book
Technology and applications of amorphous silicon /
Street, Robert A.
2000
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Elemental
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Spektroskopische Charakterisierung von Schichten und Schichtsystemen aus porösem Silicium im Hinblick auf optische und optoelektronische Anwendungen [E-Book] /
Thönissen, Markus
1999
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Elemental
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3
Book
Mikrostrukturierung von porösem Silicium für optische und optoelektronische Anwendungen /
Krüger, Michael.
1998
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4
Book
Darstellung und Charakterisierung epitaktischer 3C-SiC Schichten auf Si(100) Substraten /
Kunstmann, Thomas.
1996
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Elemental
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Available as
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3
Electronic Edition
1
Material Type
Book
4
Type of Literature
Theses
3
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ZB
4
Name
Krüger, Michael.
1
Kunstmann, Thomas.
1
Street, Robert A.
1
Thönissen, Markus
1
Subject
optoelectronics
porous silicon
2
amorphous semiconductor
1
amorphous silicon
1
characterization
1
electron microscopy
1
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microlithography
1
semiconductor heterostructure
1
silicon carbide
1
spectroscopy
1
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Classification
FJKB - Elemental semiconductors
4
CUA - Spectroscopy
1
FEJP - Porous media, capillarity
1
FFPE - Thin film electronic properties, semiconductor interfaces
1
FGM - Microelectronic technology
1
FHAB - Surface and thin film characterization
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FJEC - Amorphous semiconductors
1
FJLB - Physics of semiconductor devices
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Language
German
1
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