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1
Book
Silicides, germanides, and their interfaces: symposium : MRS fall meeting 1993 : Boston, MA, 29.11.93-02.12.93.
Fathauer, R. W.
1994
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Elemental
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2
E-Book
Untersuchungen des Wachstums und der Struktur von Siliziden mittels Rastertunnelmikroskopie und Rastertunnelspektroskopie [E-Book] /
Raunau, Werner
1993
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3
E-Book
Strukturelle und elektrische Eigenschaften von epitaktischen, metallischen und halbleitenden Siliziden [E-Book] /
Radermacher, Klaus
1993
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4
E-Book
Amorphisierung und Spannungsabbau in Silizidfilmen unter Ionenbeschuß [E-Book] /
Hardtke, Christoph
1992
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5
E-Book
Untersuchung von dünnen Silizidschichten auf Silizium mittels Elektronenspektroskopiemethoden [E-Book] /
Popovic, Srdjan
1991
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6
Book
Silicon molecular beam epitaxy : International symposium on silicon molecular beam epitaxy 0004: proceedings : MRS spring meeting 1991 : Anaheim, CA, 29.04.91-03.05.91.
Bean, J. C.
1991
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7
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International symposium on silicon molecular beam epitaxy. 0002: proceedings : Meeting of the Electrochemical Society. 0172 : Honolulu, HI, 20.10.87-23.10.87.
Bean, J. C.
1988
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8
Book
International symposium on silicon molecular beam epitaxy. 0001: proceedings : Toronto, 14.05.1985-17.05.1985.
Bean, J. C.
1985
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Available as
Electronic Edition
4
Print Edition
4
Material Type
Book
8
Type of Literature
Theses
4
Conference Publication
4
Year of Publication
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Location
ZB
8
Name
Bean, J. C.
3
Fathauer, R. W.
1
Hardtke, Christoph
1
Popovic, Srdjan
1
Radermacher, Klaus
1
Raunau, Werner
1
Subject
silicide
silicon
4
molecular beam epitaxy
3
thin film
2
amorphization
1
electrical properties
1
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electron spectroscopy
1
epitaxy
1
ion beam surface modification
1
scanning tunneling microscopy
1
semiconductor interface
1
structure
1
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Classification
FJKB - Elemental semiconductors
8
FGKC - Vacuum deposition, MBE
3
FAF - Materials research - comprehensive works
2
FFPE - Thin film electronic properties, semiconductor interfaces
2
FFP - Physics of thin films
1
FGGE - Ion beam surface modification
1
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FGML - Characterization of electronic materials
1
FHEG - Tunneling microscopy, force microscopy
1
FNPD - Hard materials, refractory compounds
1
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Language
German
4
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