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X-ray spectroscopy
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Non-destructive microanalysis of cultural heritage materials /
Janssens, K.
2004
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FPN
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Nondestructive
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Janssens, K.
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Auger electron spectroscopy
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Raman spectroscopy
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X-ray spectroscopy
electron microscopy
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inductively coupled plasma mass spectroscopy
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ion beam
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microanalysis
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CTA - Chemical analysis - comprehensive works
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CTYR - Microanalysis
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FPN - Nondestructive testing
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