1
Molecular layer functionalized neuroelectronic interfaces : from sub-nanometer molecular surface functionalization to improved mechanical and electronic cell-chip coupling /
Book
2
Molecular layer functionalized neuroelectronic interfaces : from sub-nanometer molecular surface functionalization to improved mechanicl and electronic cell-chip coupling [E-Book] /
3
An introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its application to materials science [E-Book] /
4
Secondary ion mass spectrometry : an introduction to principles and practices /
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
Table of Contents 
5
Surface analysis - the principal techniques /
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
Table of Contents 
6
Methods in physical chemistry : 2 /
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
Table of Contents 
7
The encyclopedia of mass spectrometry. 6. Molecular ionization /
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
Table of Contents 
8
Sputtering of indium under polyatomic ion bombardment [E-Book] /
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...

Full text 
9
Einführung in die Sekundärionenmassenspektrometrie - SIMS /
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
10
Inorganic trace analysis by mass spectrometry : review [E-Book] /
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...

Full text  JuSER 
11
Particle beam microanalysis : fundamentals, methods, and applications /
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
12
Secondary ion mass spectroscopy : principles and applications.
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
13
Secondary ion mass spectrometry : basic concepts, instrumental aspects, applications and trends /
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
14
Angewandte Oberflächenanalyse : mit SIMS Sekundär-Ionen-Massenspektrometrie, AES Auger-Elektronen-Spektrometrie, XPS Röntgen-Photoelektronen-Spektrometrie : 20 Tabellen /
Book
15
Secondary ion mass spectrometry: international conference 0005: proceedings : SIMS 0005: proceedings : Washington, DC, 30.09.1985-04.10.1985.
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
16
Secondary ion mass spectrometry: international conference 0004: proceedings : SIMS 0004: proceedings : Osaka, 13.11.1983-19.11.1983.
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
17
Israeli Society for Vacuum Technology : proceedings of the congress 0006 : Haifa, 04.04.1982-04.04.1982.
Book
1983
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
18
Ausgewählte Untersuchungsverfahren in der Metallkunde.
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
19
Applied atomic collision physics. 4. Condensed matter.
Book
Datz, S.
1983
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...
20
Microbeam analysis. 1982 : Annual Conference of the Microbeam Analysis Society. 0017 : Washington, DC, 09.08.1982-13.08.1982.
Book
Subject (ZB): ...SIMS (secondary ion mass spectroscopy)...