Narrow Search Results
Anderson, Jared L.
1
Beckers, Detlef
1
Berthod, Alain
1
Bravman, John C.
1
Cadieu, F. J.
1
Christou, Aris
1
more ...
Filter, William F.
1
Francombe, M. H.
1
Gusak, Andriy M.
1
Heinen, Dirk
1
Lloyd, J. R.
1
Oates, A. S.
1
Pino Estévez, Verónika
1
Rathore, H. S.
1
Rodbell, K. P.
1
Roths, Christoph
1
Schimschak, Martin
1
Schreiber, H. U.
1
Schroen, W. H.
1
Stalcup, Apryll M.
1
Yoshimori, Akio
1
see all ...
less ...
electromigration
19
metallization
6
reliability
6
microelectronics
5
mechanical stress
3
VLSI technology
2
more ...
electronic packaging
2
failure
2
thin film physics
2
HPLC (high pressure liquid chromatography)
1
adhesion
1
aluminum
1
copper
1
crystal growth
1
degradation
1
desorption
1
diffusion
1
dislocation
1
electronic structure
1
electrophoresis
1
gel electrophoresis
1
integrated circuit
1
interfacial reaction
1
liquid chromatography
1
magnetic film
1
microstructure
1
modeling
1
numerical calculation
1
packaging
1
passivation
1
see all ...
less ...
FGMH - Metallization, physics of microelectronics
13
FFA - Surface science, surface physics - general aspects
2
CTG - Electrophoresis
1
CTR - Chromatography
1
CTT - Liquid chromatography
1
FAF - Materials research - comprehensive works
1
more ...
FAN - Solid state physics - mathematical methods, computer applications
1
FDCD - Dislocations
1
FDKB - Diffusion in condensed matter
1
FFJB - Surface dynamics
1
FFJK - Surface reactions
1
FFP - Physics of thin films
1
FGK - Thin film technology, epitaxy
1
FGM - Microelectronic technology
1
FGN - Nanotechnology
1
FMGH - Metallographic microscopy, metallographic stereology
1
see all ...
less ...