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Secondary ion mass spectrometry : International Conference on Secondary Ion Mass Spectrometry. 0006: proceedings : SIMS. 0006: proceedings : Versailles, 13.09.87-18.09.87.
Benninghoven, A.
1988
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IBN-1-2
IEK-14
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Benninghoven, A.
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FGGJ - Ion beam analysis, ion beam solid interaction
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