ZB 8 IBN-3-4 2 IBN-1-2 1

Cardona, Manuel. 2 Yu, Peter Y. 2 Alberg, Teijo 1 Brümmer, Otto. 1 Dlubek, G. 1 Flügge, Siegfried 1 more ... Gauglitz, Günter 1 Ghosh, P. K. 1 Gorley, Stephan V. 1 Hunger, H. J. 1 Koch, Ernst Eckhard 1 Mehlhorn, Werner 1 see all ... less ...

photoelectron spectroscopy 9 Auger electron spectroscopy 2 SIMS (secondary ion mass spectroscopy) 2 X-ray diffraction 2 band structure 2 defect 2 more ... electron microprobe analysis 2 electron phonon interaction 2 electronic properties 2 optical properties 2 semiconductor physics 2 surface analysis 2 Mössbauer spectroscopy 1 Raman spectroscopy 1 X-ray microscopy 1 bioreactor 1 cleaning 1 composite materials 1 electric appliance 1 electron spectroscopy 1 gas cleaning 1 glass 1 gradient method 1 interaction 1 ion microprobe analysis 1 lactic acid 1 liquid membrane 1 membrane 1 membrane reactor 1 membrane separation 1 see all ... less ...

FJH - Semiconductor physics 2 CLPS - Organic colloids, membranes 1 CUA - Spectroscopy 1 CUM - Laser spectroscopy 1 CUO - Molecular spectroscopy 1 CUSE - Raman spectroscopy 1 more ... CWSW - Membrane separation process 1 FFGC - Electron spectroscopy 1 FGGJ - Ion beam analysis, ion beam solid interaction 1 FHA - Materials characterization - general aspects 1 FHAB - Surface and thin film characterization 1 FHJC - Microbeam analysis 1 FHL - Synchrotron radiation techniques 1 FME - Metallurgical investigation methods - surveys, general aspects 1 PED - Particle radiation, particle optics 1 PJA - Atomic physics - general 1 see all ... less ...

English 2