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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography /
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Subject (ZB): “...transmission electron microscopy...”
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Quantitative investigation of group III-nitride interfaces by a combination of scanning tunneling microscopy and off-axis electron holography [E-Book] /
Subject (ZB): “...transmission electron microscopy...”

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Beurteilung der optischen Eigenschaften von AlGaInP hergestellt in der metallorganischen Gasphasenepitaxie unter Stickstoff- oder Wasserstoffatmosphäre [E-Book] /
Subject (ZB): “...transmission electron microscopy...”

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Properties of III-V quantum wells and superlattices.
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Subject (ZB): “...transmission electron microscopy...”
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Determining nanoscale physical properties of materials by microscopy and spectroscopy: symposium : Boston, MA, 29.11.93-03.12.93.
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Subject (ZB): “...transmission electron microscopy...”
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Elektronenmikroskopische Charakterisierung von Versetzungen in plastisch verformtem InP [E-Book] /
Subject (ZB): “...transmission electron microscopy...”

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TEM/TED studies of epitaxial layers of ternary and quaternary group III-V compound semiconductor alloys.
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Subject (ZB): “...transmission electron microscopy...”
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