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SIMS (secondary ion mass spectroscopy)
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SIMS (secondary ion mass spectroscopy)
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1
Book
Methods in physical chemistry : 2 /
Schäfer, R.
2012
Subject (ZB):
“
...
transmission
electron
microscopy
...
”
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2
Book
Particle beam microanalysis : fundamentals, methods, and applications /
Fuchs, Ekkehard.
1990
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...
transmission
electron
microscopy
...
”
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3
Book
Ausgewählte Untersuchungsverfahren in der Metallkunde.
Hunger, H. J.
1983
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...
transmission
electron
microscopy
...
”
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3
Material Type
Book
3
Type of Literature
Handbook, Textbook
1
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Location
ZB
3
Name
Dlubek, G.
1
Fuchs, Ekkehard.
1
Hunger, H. J.
1
Oppolzer, Helmut.
1
Rehme, Hans.
1
Schäfer, R.
1
Subject
SIMS (secondary ion mass spectroscopy)
transmission electron microscopy
3
Auger electron spectroscopy
2
photoelectron spectroscopy
2
scanning electron microscopy
2
Fourier transform infrared spectroscopy
1
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LEED (low energy electron diffraction)
1
Mössbauer spectroscopy
1
X-ray diffraction
1
X-ray microanalysis
1
electron beam analysis
1
electron microprobe analysis
1
fluorescence spectroscopy
1
ion microprobe analysis
1
metallography
1
microprobe analysis
1
neutron scattering
1
physical chemistry
1
positron annihilation
1
raman spectroscopy
1
scanning tunneling microscopy
1
solid state spectroscopy
1
thermal analysis
1
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Classification
CHG - Physical chemistry - general aspects
1
CUA - Spectroscopy
1
FHA - Materials characterization - general aspects
1
FHJC - Microbeam analysis
1
FME - Metallurgical investigation methods - surveys, general aspects
1
Language
English
1
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