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X-ray diffraction
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1
Book
Materials characterization : introduction to microscopic and spectroscopic methods /
Leng, Yang
2013
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“
...
transmission
electron
microscopy
...
”
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2
Book
Effect of disorder and defects in ion-implanted semiconductors : electrical and physiochemical characterization /
Ghibaudo, Gerard
1997
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transmission
electron
microscopy
...
”
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3
Book
Properties of III-V quantum wells and superlattices.
Bhattacharya, P.
1996
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...
transmission
electron
microscopy
...
”
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4
Book
Characterization of materials. 1.
Lifshin, E,
1992
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transmission
electron
microscopy
...
”
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5
Book
Ausgewählte Untersuchungsverfahren in der Metallkunde.
Hunger, H. J.
1983
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transmission
electron
microscopy
...
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Available as
Print Edition
5
Material Type
Book
5
Type of Literature
Handbook, Textbook
1
Year of Publication
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To:
Location
ZB
4
IBN-1-2
1
Name
Bhattacharya, P.
1
Dlubek, G.
1
Ghibaudo, Gerard
1
Hunger, H. J.
1
Leng, Yang
1
Lifshin, E,
1
Subject
X-ray diffraction
transmission electron microscopy
5
materials characterization
2
scanning electron microscopy
2
solid state spectroscopy
2
Auger electron spectroscopy
1
more ...
III - V semiconductor
1
Mössbauer spectroscopy
1
SIMS (secondary ion mass spectroscopy)
1
X-ray fluorescence analysis
1
amorphous semiconductor
1
atomic spectroscopy
1
band structure
1
disorder phenomena
1
electric field
1
electron diffraction
1
electron microprobe analysis
1
electron microscopy
1
energy level
1
epitaxy
1
exciton
1
gallium arsenide
1
growth
1
impurity
1
indium phosphide
1
interface
1
ion implantation
1
ion microprobe analysis
1
line broadening
1
magnetic field
1
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Classification
FHA - Materials characterization - general aspects
3
FAF - Materials research - comprehensive works
1
FFPG - Multilayer systems, quantum structures
1
FGGB - Ion implantation, ion beam synthesis
1
FJHE - Defects and radiation effects in semiconductors
1
FME - Metallurgical investigation methods - surveys, general aspects
1
Language
English
1
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