Skip to content
Toggle navigation
VuFind
0
Items in e-Shelf
(Full)
History
User Account
Logout
User Account
Help
English
Deutsch
Books & more
Articles & more
JuSER
All Fields
Title
Journal Title
Name
Institution
Subject
Classification
Shelf Classification
Table of Contents
DOI
ISBN/ISSN
Call number
Report Number
Barcode
Full Texts (available in selection)
Find
Advanced
Ask a Librarian
Books & more
: Hits
1 - 1
of
1
sort by
Relevance
Year (descending)
Year (ascending)
Call Number
Author
Title
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Select result number 1
1
Book
Materials reliability in microelectronics. 8 : symposium held April 13-16, 1998, San Francisco, California, USA /
Bravman
,
John
C
.
1998
Other Personal Name(s):
“
...
Bravman
,
John
C
....
”
Call number:
Loading...
Located:
Loading...
Loading...
Literature Request
Loan/Reservation
Favorites
Saved in:
QR Code
Select all titles on this page
Email
Export
Print
Save
Add to e-Shelf
Back
Narrow Search Results
Available as
Print Edition
1
Material Type
Book
1
Type of Literature
Conference Publication
1
Year of Publication
From:
To:
Location
IFF
1
Name
Bravman, John C.
1
Subject
electromigration
1
microelectronics
1
reliability
1
Classification
FGMH - Metallization, physics of microelectronics
1
×
Loading...
