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1
Book
Fundamentals of nanoscale film analysis /
Alford, Terry L.
2007
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...
Mayer
,
James
W
....
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2
Book
Handbook of modern ion beam materials analysis /
Tesmer, Joseph R.
1995
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...
Mayer
,
James
W
....
”
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ZB
2
IEK-4
1
Name
Mayer, James W.
2
Alford, Terry L.
1
Barbour, J. Charles
1
Feldman, Leonard C.
1
Maggiore, Carl J.
1
Nastasi, Michael
1
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Tesmer, Joseph R.
1
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Subject
thin film
accelerator
1
activation analysis
1
backscattering
1
channeling
1
charged particle
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energy loss
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instrumentation
1
ion beam analysis
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materials characterization
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radiology
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Classification
FGGJ - Ion beam analysis, ion beam solid interaction
1
FHAB - Surface and thin film characterization
1
Language
English
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