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E-Book
Modern methods of specimen preparation for TEM including focused ion beam (FIB) [E-Book] : proceedings of the 1st Summer School on Advanced Electron Microscopy, 30.6. - 5.7.2003, K...
Penkalla
,
Heinz
-
Josef
2003
Other Personal Name(s):
“
...
Penkalla
,
Heinz
-
Josef
...
”
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Penkalla, Heinz-Josef
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sample preparation
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transmission electron microscopy
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FHGB - Conventional electron microscopy
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English
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