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1
Book
Atomic force microscopy /
Voigtländer
,
Bert
2019
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Voigtländer
,
Bert
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2
E-Book
Atomic Force Microscopy [E-Book] /
Voigtländer
,
Bert
2019
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Voigtländer
,
Bert
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3
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Memristive phenomena - from fundamental physics to neuromorphic computing : this spring school was organized by the Peter Grünberg Institute, Forschungszentrum Jülich and Physics I...
Waser, Rainer
2016
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Voigtländer
,
Bert
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4
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Memristive phenomena - from fundamental physics to neuromorphic computing : this spring school was organized by the Peter Grünberg Institute, Forschungszentrum Jülich and Physics I...
Waser, Rainer
2016
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Voigtländer
,
Bert
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5
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Scanning probe microscopy : atomic force microscopy and scanning tunneling microscopy /
Voigtländer
,
Bert
2015
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Voigtländer
,
Bert
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6
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Scanning Probe Microscopy [E-Book] : Atomic Force Microscopy and Scanning Tunneling Microscopy /
Voigtländer
,
Bert
.
2015
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,
Bert
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7
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Struktursymmetrie und Phononen an adsorbatbedeckten Nickel(110)- und reinen Gold(110)- Oberflächen [E-Book] /
Voigtländer
,
Bert
1989
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Voigtländer
,
Bert
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Available as
Electronic Edition
4
Print Edition
3
Material Type
Book
7
Type of Literature
Conference Publication
2
Handbook, Textbook
1
Theses
1
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ZB
6
PGI-3
2
IBI-2
1
PGI-7
1
Name
Voigtländer, Bert
6
Bihlmayer, Gustav
2
Blügel, Stefan
2
Boothroyd, Christopher Brian
2
Bürgler, Daniel E.
2
DiVincenzo, David P.
2
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Dittmann, Regina
2
Ebert, Philip
2
Gunkel, Felix
2
Hoffmann-Eifert, Susanne
2
Jia, Chun-Lin
2
Mavropoulos, Phivos
2
Menzel, Stephan
2
Moers, Jürgen
2
Moors, Marco
2
Pithan, Christian
2
Plucinski, Lukasz
2
Schneider, Claus M.
2
Valov, Ilia
2
Waser, Rainer
2
Wortmann, Daniel
2
Wuttig, Matthias
2
Voigtländer, Bert.
1
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Subject
force microscopy
4
scanning probe microscopy
4
Engineering.
2
Nanotechnology.
2
memory
2
nanoelectronics
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resistance
2
resistive switching
2
solid state device
2
Microscopy.
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Classification
FAF - Materials research - comprehensive works
2
FGP - Nanoelectronics
2
FJL - Physics of solid state devices
2
FFJB - Surface dynamics
1
FHE - Imaging methods in materials characterization
1
FHEG - Tunneling microscopy, force microscopy
1
Language
English
6
German
1
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